Solution
Yield Prediction
Forecast lot and wafer yield from inline data — days before final test closes the loop. Catch the drift while there is still time to act.
Forecast confidence
38 lots · 300mm logic · updated 4m ago
By the time final test confirms a miss, the fab has moved on.
Inline metrology throws off thousands of readings a shift, but nobody stitches them into a forecast until the lot reaches final test — three or four process steps past the point an engineer could still intervene. Yield surprises get discovered, not predicted.
How it works
01
Ingest
Pull inline data
02
Model
Learn the baseline signal
03
Forecast
Score every lot in flight
Yield Forecast
Scrub across lots to see the forecast.
Each point blends inline metrology into a per-lot yield forecast. Solid is confirmed, dashed is projected, and the shaded band is the confidence range.
Lot
A7-1183
Forecast yield
93.1%
Confidence
81%
Projected
Capabilities
Inline-to-final modeling
Trains against your own final-test history so forecasts reflect this fab, not an industry average.
Per-lot confidence scoring
Every forecast ships with a confidence range that narrows as more inline data lands.
Drift alerts
Flags a lot the moment its forecast trajectory breaks from the baseline — before final test.
Model retraining cadence
Retrains automatically against new final-test results, so the model keeps pace with process changes.
Explainable forecasts
Every prediction traces back to the inline readings that drove it — no black box.
Specs
Formats
KLARF, STDF v4, SECS/GEM, inline SPC feeds
Deployment
SaaS, On-prem, Air-gapped
Standards
SEMI E10/E58
Security
SOC 2 Type II, SSO/SAML, RBAC
Forecast the lot. Not just the wafer.
Bring 90 days of inline and final-test history to a 30-minute session and see the model score live lots.