Platform

One yield model. Every data source.

Yieldform unifies inline metrology, wafer sort, and final-test data into a single live model — then runs three modules on top of it: defect classification, yield forecasting, and alert routing. One ingestion pipeline, three ways to act on it.

See the modules ↓

3 modules · 1 data model 50+ inspection tools SOC 2 Type II

How data moves through the platform.

Ingest

KLARF, STDF, SECS/GEM, inline SPC feeds — pulled in as-is, no custom parser per tool.

Unify

Every reading normalized onto one wafer-level model, keyed by lot, wafer, die, and step.

Analyze

Classification, forecasting, and correlation run continuously against the live model.

Act

Ranked causes and routed alerts reach the engineer who owns the tool — before the lot moves on.

Solutions

One platform, three ways to defend yield.

Defect Analytics

Classify, correlate, and rank the defect signatures driving yield loss.

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Yield Prediction

Forecast lot and wafer yield from inline data before final test.

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Fab Command

Every excursion, routed to the right engineer in real time.

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Speaks your fab's dialects.

Yieldform ingests the formats already coming off your tools — no bespoke connector per inspection station.

KLARF 1.2 / 1.8 STDF v4 SECS/GEM EDA/Interface A Inline SPC feeds MES event logs

Specs

Formats

KLARF, STDF v4, SECS/GEM, EDA/Interface A

Deployment

SaaS, On-prem, Air-gapped

Standards

SEMI E10/E58

Security

SOC 2 Type II, SSO/SAML, RBAC

See your own data in the platform.

Bring a lot of KLARF or STDF files to a 30-minute session and watch it run through all three modules.